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IEC 62132-2:2010 ED1

Integrated circuits - Measurement of electromagnetic immunity - Part 2: Measurement of radiated immunity - TEM cell and wideband TEM cell method IEC 62132-2:2010 ED1

Publication date:   Mar 30, 2010

General information

60.60 Standard published   Mar 30, 2010

IEC

TC 47/SC 47A

International Standard

31.200   Integrated circuits. Microelectronics

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Scope

IEC 62132-2:2010 specifies a method for measuring the immunity of an integrated circuit (IC) to radio frequency (RF) radiated electromagnetic disturbances. The frequency range of this method is from 150 kHz to 1 GHz, or as limited by the characteristics of the TEM cell.

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PUBLISHED
IEC 62132-2:2010 ED1
60.60 Standard published
Mar 30, 2010