95.99 Withdrawal of Standard Oct 21, 2024
IEC
International Standard
31.200 Integrated circuits. Microelectronics
Describes a method to measure the conducted electromagnetic emission of integrated circuits either applied on a standardised test-board or on a final printed circuit board (PCB). Has a high repeatability and a good relationship to the measured RF emission of final applications with the integrated circuits used.
WITHDRAWN
IEC 61967-5:2003 ED1
95.99
Withdrawal of Standard
Oct 21, 2024