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IEC 61967-1 ED3

Integrated circuits - Measurement of electromagnetic emissions - Part 1: General conditions and definitions

General information

30.20   CD study/ballot initiated   Sep 4, 2026

PCC    Oct 30, 2026

IEC

TC 47/SC 47A

International Standard

31.200   Integrated circuits. Microelectronics

Life cycle

PREVIOUSLY

PUBLISHED
IEC 61967-1:2018 ED2

NOW

IN_DEVELOPMENT
IEC 61967-1 ED3
30.20 CD study/ballot initiated
Sep 4, 2026