IEC 61189-3:1997+AMD1:1999 CSV ED1.1

Test methods for electrical materials, interconnection structures and assemblies - Part 3: Test methods for interconnection structures (printed boards)

General information

99.60   Withdrawal effective   Oct 9, 2007

IEC

TC 91 Electronics assembly technology

International Standard

31.180   Printed circuits and boards

Scope

Provides a catalogue of test methods representing methodologies and procedures that can be applied to test materials used for manufacturing interconnection structures (printed boards) and assemblies. It mainly covers chemical, mechanical and electrical test methods.

This consolidated version consists of the first edition (1997)
and its amendment 1 (1999). Therefore, no need to order amendment in
addition to this publication.

Life cycle

NOW

WITHDRAWN
IEC 61189-3:1997+AMD1:1999 CSV ED1.1
99.60 Withdrawal effective
Oct 9, 2007

REVISED BY

PUBLISHED
IEC 61189-3:2007 ED2