IEC 61163-1:1995 ED1

Reliability stress screening - Part 1: Repairable items manufactured in lots IEC 61163-1:1995 ED1

Publication date:   Aug 14, 1995

General information

99.60 Withdrawal effective   Jun 26, 2006

IEC

TC 56

International Standard

03.120.01   Quality in general | 03.120.30   Application of statistical methods | 21.020   Characteristics and design of machines, apparatus, equipment

Buying

Revised

Language in which you want to receive the document.

Scope

These processes are applicable for lots of repairable hardware items, in cases where the items have an unacceptably low reliability in the early failure period, and when other methods, like reliability growth programmes and quality control techniques, are not applicable.

Life cycle

NOW

WITHDRAWN
IEC 61163-1:1995 ED1
99.60 Withdrawal effective
Jun 26, 2006

CORRIGENDA / AMENDMENTS

WITHDRAWN
IEC 61163-1:1995/COR1:1999 ED1

REVISED BY

PUBLISHED
IEC 61163-1:2006 ED2