Establishes a common and reproducible reference for evaluating the immunity of electrical and electronic equipment when subjected to electrical fast transient/bursts on supply, signal, control and earth ports. The test method documented in this part of IEC 61000-4 describes a consistent method to assess the immunity of an equipment or system against a defined phenomenon.
The standard defines:
- test voltage waveform;
- range of test levels;
- test equipment;
- verification procedures of test equipment;
- test set-up;
- test procedure.
The standard gives specifications for laboratory and post-installation tests.
The contents of the corrigenda of August 2006 and June 2007 have been included in this copy.
WITHDRAWN
IEC 61000-4-4:1995 ED1
WITHDRAWN
IEC 61000-4-4:1995/AMD2:2001 ED1
WITHDRAWN
IEC 61000-4-4:1995/AMD1:2000 ED1
WITHDRAWN
IEC 61000-4-4:2004 ED2
99.60
Withdrawal effective
Apr 30, 2012
WITHDRAWN
IEC 61000-4-4:2004/COR1:2006 ED2
WITHDRAWN
IEC 61000-4-4:2004/COR2:2007 ED2
WITHDRAWN
IEC 61000-4-4:2004/AMD1:2010 ED2
PUBLISHED
IEC 61000-4-4:2012 ED3