Relates to the immunity requirements and test methods for
electrical and electronic equipment to repetitive electrical fast
transients. Additionally defines ranges of test levels and
establishes test procedures.
The object of this standard is to establish a common and
reproducible basis for evaluating the performance of electrical and
electronic equipment when subjected to repetitive fast transients
(bursts), on supply, signal and control ports.
The test is intended to demonstrate the immunity of electrical and
electronic equipment when subjected to types of transient
disturbances such as those originating from switching transients
(interruption of inductive loads, relay contact bounce, etc.). The
standard defines:
- test voltage waveform;
- range of test levels;
- test equipment;
- test set-up;
- test procedure.
WITHDRAWN
IEC 60801-4:1988 ED1
WITHDRAWN
IEC 61000-4-4:1995 ED1
99.60
Withdrawal effective
Jul 8, 2004
WITHDRAWN
IEC 61000-4-4:1995/AMD2:2001 ED1
WITHDRAWN
IEC 61000-4-4:1995/AMD1:2000 ED1
WITHDRAWN
IEC 61000-4-4:2004 ED2