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IEC 61000-4-20:2003/AMD1:2006 ED1

Amendment 1 - Electromagnetic compatibility (EMC) - Part 4-20: Testing and measurement techniques - Emission and immunity testing in transverse electromagnetic (TEM) waveguides

Publication date:   Nov 15, 2006

General information

99.60 Withdrawal effective   Aug 31, 2010

IEC

TC 77/SC 77B

International Standard

33.100.10   Emission | 33.100.20   Immunity

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Life cycle

PREVIOUSLY

WITHDRAWN
IEC 61000-4-20:2003 ED1

NOW

WITHDRAWN
IEC 61000-4-20:2003/AMD1:2006 ED1
99.60 Withdrawal effective
Aug 31, 2010

REVISED BY

WITHDRAWN
IEC 61000-4-20:2010 ED2