IEC 61000-4-11:1994+AMD1:2000 CSV ED1.1

Electromagnetic compatibility (EMC) - Part 4-11: Testing and measurement techniques - Voltage dips, short interruptions and voltage variations immunity tests IEC 61000-4-11:1994+AMD1:2000 CSV ED1.1

Scope

This standard defines the immunity test methods and range of
preferred test levels for electrical and electronic equipment
connected to low voltage power supply networks for voltages dips,
short interruptions, and voltage variations. It applies to
electrical and electronic equipment having a rated input current
not exceeding 16 A per phase. It does not apply to electrical and
electronic equipment for connection to d.c. networks or 400 Hz a.c.
networks.