IEC 60769:1983 ED1

Ionizing radiation measurement systems with analogue or digital signal processing for thickness measurements. IEC 60769:1983 ED1

Publication date:   Jan 1, 1983

General information

99.60 Withdrawal effective   Nov 28, 1996

IEC

TC 45

International Standard

17.240   Radiation measurements

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Scope

Deals with definitions and test requirements for ionizing radiation measurement systems designed for either continuous or discrete measurement and checks of thickness, mass per unit area, or mass per unit length on industrial processes, of material in such forms as sheets, coatings, laminates, tubes, or rods.
This publication replaces IEC 577 (1977).

Life cycle

PREVIOUSLY

WITHDRAWN
IEC 60577:1977 ED1

NOW

WITHDRAWN
IEC 60769:1983 ED1
99.60 Withdrawal effective
Nov 28, 1996

REVISED BY

PUBLISHED
IEC 61336:1996 ED1