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IEC 60749/AMD4/FRAG6 ED1

Amendments to IEC 749 - Inclusion of optoelectronic semi-conductor devices - Inclusion of LCD devices - Endurance tests IEC 60749/AMD4/FRAG6 ED1

General information

10.98   New project rejected   Oct 28, 1994

IEC

TC 47

International Standard

Life cycle

NOW

ABANDON
IEC 60749/AMD4/FRAG6 ED1
10.98 New project rejected
Oct 28, 1994

REVISED BY

WITHDRAWN
IEC 60749:1996 ED2




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