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IEC 60749/AMD4/FRAG4 ED1

Amendment to IEC 749 - Clause 1: Substrate bending test for SMD-Semiconductors IEC 60749/AMD4/FRAG4 ED1

General information

10.98   New project rejected   Nov 10, 1995

IEC

TC 47

International Standard

Life cycle

NOW

ABANDON
IEC 60749/AMD4/FRAG4 ED1
10.98 New project rejected
Nov 10, 1995

REVISED BY

WITHDRAWN
IEC 60749:1996 ED2




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