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IEC 60749-28/FRAG1 ED1

Semiconductor devices - Mechanical and climatic test methods - Part 28: Electrostatic discharge (ESD) sensitivity testing - Charged device model (CDM)

General information

30.97   End of interruption of work - split/merged  

IEC

TC 47

International Standard

Life cycle

NOW

ABANDON
IEC 60749-28/FRAG1 ED1
30.97 End of interruption of work - split/merged

REVISED BY

PUBLISHED
IEC 60749-28:2022 ED2