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IEC 60747-7/AMD3/FRAG7 ED1

Supplement to Chapter IV of IEC 747-7 - Measuring method for noise figure and power gain of bipolar transistors IEC 60747-7/AMD3/FRAG7 ED1

General information

10.98   New project rejected   Dec 31, 1994

IEC

TC 47/SC 47E

International Standard

Life cycle

NOW

ABANDON
IEC 60747-7/AMD3/FRAG7 ED1
10.98 New project rejected
Dec 31, 1994

REVISED BY

WITHDRAWN
IEC 60747-7:2000 ED2




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