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IEC 60747-5-9:2019 ED1

Semiconductor devices - Part 5-9: Optoelectronic devices - Light emitting diodes - Test method of the internal quantum efficiency based on the temperature-dependent electroluminescence

Publication date:   Dec 11, 2019

General information

60.60 Standard published   Dec 11, 2019

IEC

TC 47/SC 47E

International Standard

31.080.99   Other semiconductor devices

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Scope

IEC 60747-5-9:2019(E) specifies the measuring method of the internal quantum efficiency (IQE) of single light emitting diode (LED) chips or packages without phosphor. White LEDs for lighting applications are out of the scope of this document. This document utilizes the relative external quantum efficiencies (EQEs) measured at cryogenic temperatures and at an operating temperature, which is called temperature-dependent electroluminescence (TDEL). In order to identify the reference IQE of 100 %, the maximum values of the peak EQE are found by varying the environmental temperature and current.

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PUBLISHED
IEC 60747-5-9:2019 ED1
60.60 Standard published
Dec 11, 2019