IEC 60747-5-3:1997+AMD1:2002 CSV ED1.1

Discrete semiconductor devices and integrated circuits - Part 5-3: Optoelectronic devices - Measuring methods

Scope

IEC 60747-5-3:1997+A1:2002 describes the measuring methods applicable to the optoelectronic devices which are not intended to be used in the fibre optic systems or subsystems.

This consolidated version consists of the first edition (1997)
and its amendment 1 (2002). Therefore, no need to order amendment in
addition to this publication.
This publication is to be read in conjunction with IEC 60747-1:2006, IEC 62007-1:2008 and IEC 62007-2:2009.