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IEC 60747-5-18:2026 ED1

Semiconductor devices - Part 5-18: Optoelectronic devices - Light emitting diodes - Test method of the macro photoluminescence for epitaxial wafers of micro light emitting diodes

Publication date:   Jun 11, 2026

General information

60.60   Standard published   Jun 11, 2026

IEC

TC 47/SC 47E

International Standard

31.080.99   Other semiconductor devices

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Scope

IEC 60747-5-18:2026 specifies the measuring methods of macro photoluminescence (PL) for red, green, and blue epitaxial wafers of micro light emitting diodes (LEDs) prior to chip fabrication processes. Wafer sizes being considered are 4 in, 6 in, and 8 in in diameter.

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PUBLISHED
IEC 60747-5-18:2026 ED1
60.60 Standard published
Jun 11, 2026