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IEC 60747-4/AMD2/FRAG4 ED1

Revised and additional measuring methods for microwave field effect transistors - Amendment to Document 47(C.O.)1261

General information

30.97   End of interruption of work - split/merged   Mar 15, 1996

IEC

TC 47/SC 47E

International Standard

Life cycle

NOW

ABANDON
IEC 60747-4/AMD2/FRAG4 ED1
30.97 End of interruption of work - split/merged
Mar 15, 1996

REVISED BY

PUBLISHED
IEC 60747-4:2007 ED2