60.60 Standard published Apr 29, 2009
IEC
International Standard
31.080.99 Other semiconductor devices
IEC 60747-14-3:2009 specifies requirements for semiconductor pressure sensors measuring absolute, gauge or differential pressures. The major technical change with regard to the previous edition is the addition of a new subclause 5.9 (measuring method of linearity).
This publication should be read in conjunction with IEC 60747-1:2006.
WITHDRAWN
IEC 60747-14-3:2001 ED1
PUBLISHED
IEC 60747-14-3:2009 ED2
60.60
Standard published
Apr 29, 2009