IEC 60747-14-16 ED1

Semiconductor devices - Part 14-16: Semiconductor sensors - Performance test method for capacitive fingerprint sensors IEC 60747-14-16 ED1

Current stage: 20.99 WD approved for registration as CD Jul 31, 2026

Next stage: CD Next stage date : Jul 31, 2026

Originator: IEC

Type: International Standard

ICS: 31.080.99 Other semiconductor devices

IN_DEVELOPMENT
IEC 60747-14-16 ED1
20.99 WD approved for registration as CD
Jul 31, 2026

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