IEC 60747-12:1991 ED1

Semiconductor devices - Part 12: Sectional specification for optoelectronic devices IEC 60747-12:1991 ED1

Publication date:   Sep 15, 1991

95.99 Withdrawal of Standard   Feb 15, 2005

General information

95.99 Withdrawal of Standard   Feb 15, 2005

IEC

TC 110

International Standard

31.260   Optoelectronics. Laser equipment

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Scope

Gives details of the quality assessment procedures, the inspection
requirements, screening sequences, sampling requirements, test and
measurement procedures required for semiconductor optoelectronic
devices. Applies to:
-Semiconductor photo-emitters;
opto-electronic displays;
light-emitting diodes (LED);
laser diodes.
-Semiconductor photosensitive devices;
photodiodes;
phototransistors;
photothyristors.
-Semiconductor imaging devices.
-Photocouplers, optocouplers.

Life cycle

NOW

WITHDRAWN
IEC 60747-12:1991 ED1
95.99 Withdrawal of Standard
Feb 15, 2005

REVISED BY

ABANDON
IEC 60747-12 ED2