IEC 60596:1978 ED1

Name: IEC 60596:1978 ED1
Brand: IEC
SKU: IEC 60596:1978 ED1
Price: 48.4 EUR
Availability: InStock
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Definitions of test method terms for semiconductor radiation detectors and scintillation counting

Current stage: 95.99 Withdrawal of Standard Aug 1, 1993

Originator: IEC

Owner: TC 45

Type: International Standard

Status: Withdrawn

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Languages: English French Russian

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Concerns the test methods described in IEC 333.

WITHDRAWN
IEC 60596:1978 ED1
95.99 Withdrawal of Standard
Aug 1, 1993