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IEC 60444-11:2010 ED1

Measurement of quartz crystal unit parameters - Part 11: Standard method for the determination of the load resonance frequency f<sub>L</sub> and the effective load capacitance C<sub>Leff</sub> using automatic network analyzer techniques and error correction IEC 60444-11:2010 ED1

Publication date:   Oct 7, 2010

General information

99.60   Withdrawal effective   Apr 22, 2026

IEC

TC 49

International Standard

31.140   Piezoelectric devices

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Revised

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Scope

IEC 60444-11:2010 defines the standard method of measuring load resonance frequency fL at the nominal value of CL, and the determination of the effective load capacitance CLeff at the nominal frequency for crystals with the figure of merit M > 4.

Life cycle

NOW

WITHDRAWN
IEC 60444-11:2010 ED1
99.60 Withdrawal effective
Apr 22, 2026

REVISED BY

PUBLISHED
IEC 60444-11:2026 ED2




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