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IEC 60419:1973 ED1

Guide for the inclusion of lot-by-lot and periodic inspection procedures in specifications for electronic components (or parts) IEC 60419:1973 ED1

Publication date:   Jan 1, 1973

95.99   Withdrawal of Standard   Jan 23, 1998

General information

95.99   Withdrawal of Standard   Jan 23, 1998

IEC

TC 56

International Standard

31.020   Electronic components in general

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Scope

Constitutes guidance for the inclusion in specifications for electronic components of procedures concerning lot-by-lot and
periodic inspection and contains an appendix indicating the
relationship of tests concerning these inspections.

Life cycle

NOW

WITHDRAWN
IEC 60419:1973 ED1
95.99 Withdrawal of Standard
Jan 23, 1998

REVISED BY

ABANDON
IEC 60419 ED2




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