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IEC 60410:1973 ED1

Sampling plans and procedures for inspection by attributes IEC 60410:1973 ED1

Publication date:   Jan 1, 1973

95.99   Withdrawal of Standard   Oct 30, 2015

General information

95.99   Withdrawal of Standard   Oct 30, 2015

IEC

TC 56

International Standard

21.020   Characteristics and design of machines, apparatus, equipment | 31.020   Electronic components in general

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Scope

Establishes sampling plans and procedures for inspection by attributes. These sampling plans are applicable, but not limited, to inspection of end items, components and raw materials, operations, materials in process, supplies in storage, maintenance operations, data or records and administrative procedures.

Life cycle

NOW

WITHDRAWN
IEC 60410:1973 ED1
95.99 Withdrawal of Standard
Oct 30, 2015

REVISED BY

ABANDON
IEC 60410 ED2




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