IEC 60333:1993 ED3

Nuclear instrumentation - Semiconductor charged-particle detectors - Test procedures

Publication date:   Jul 14, 1993

95.99   Withdrawal of Standard   Jul 15, 2010

General information

95.99   Withdrawal of Standard   Jul 15, 2010

IEC

TC 45

International Standard

17.240   Radiation measurements

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Scope

Applies to semiconductor radiation detectors which are used for the detection and high-resolution spectroscopy of charged particles. The measurement techniques described have been selected to be readily available to all manufacturers and users of semiconductor charged-particle detectors.

Life cycle

PREVIOUSLY

WITHDRAWN
IEC 60333:1983 ED2

NOW

WITHDRAWN
IEC 60333:1993 ED3
95.99 Withdrawal of Standard
Jul 15, 2010