IEC 60147-2K:1978 ED1

Supplement K - Essential ratings and characteristics of semiconductor devices and general principles of measuring methods - Part 2: General principles of measuring methods

Publication date:   Jan 1, 1978

95.99   Withdrawal of Standard   Mar 31, 1995

General information

95.99   Withdrawal of Standard   Mar 31, 1995

IEC

TC 47

International Standard

31.080.10   Diodes

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Scope

Gives an alternative method to that described in IEC 147-2F for measuring the main parameters of varactor diodes by means of a coaxial cavity. Describes the methods of measurement for microwave mixer diodes, i.e. in addition to measurement of d.c. parameters, those of rectified current, intermediate frequency impedance, voltage standing wave ratio, overall noise factor, output noise ratio, conversion loss, burnout energy.

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NOW

WITHDRAWN
IEC 60147-2K:1978 ED1
95.99 Withdrawal of Standard
Mar 31, 1995

REVISED BY

ABANDON
IEC 60147-2K ED2