IEC 60147-1:1963 ED1

Essential ratings and characteristics of semiconductor devices and general principles of measuring methods - Part 1: Essential ratings and characteristics IEC 60147-1:1963 ED1

Publication date:   Jan 1, 1963

General information

99.60   Withdrawal effective   Nov 19, 2016

IEC

TC 47

International Standard

31.080.10   Diodes

Buying

Revised

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Scope

This second edition supersedes IEC 147-1 (1963) and 147-1A (1963).
Provides for each type of semiconductor device a list of essential ratings and characteristics, the primary purpose of which is to facilitate comparison between similar products. This part deals with low-power signal diodes (including switching); voltage reference and voltage regulator diodes; low power, signal, bipolar transistors; power bipolar transistors (excluding switching and high-frequency applications); switching bipolar transistors; field effect transistors.

Life cycle

NOW

WITHDRAWN
IEC 60147-1:1963 ED1
99.60 Withdrawal effective
Nov 19, 2016

REVISED BY

WITHDRAWN
IEC 60147-1:1972 ED2




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