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IEC 60147-0E:1979 ED1

Supplement E - Essential ratings and characteristics et semiconductor devices and general principles of measuring methods - Part 0: General and terminology

Publication date:   Jan 1, 1979

General information

99.60 Withdrawal effective   Nov 19, 2016

IEC

TC 47

International Standard

31.080.10   Diodes

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Life cycle

NOW

WITHDRAWN
IEC 60147-0E:1979 ED1
99.60 Withdrawal effective
Nov 19, 2016

REVISED BY

WITHDRAWN
IEC 60747-2:1983 ED1

WITHDRAWN
IEC 60747-3:1985 ED1