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IEC 60147-0:1966 ED1

Essential ratings and characteristics of semiconductor devices and general principles of measuring methods - Part 0: General and terminology IEC 60147-0:1966 ED1

Publication date:   Jan 1, 1966

95.99   Withdrawal of Standard   Mar 31, 1995

General information

95.99   Withdrawal of Standard   Mar 31, 1995

IEC

TC 47

International Standard

31.080.10   Diodes

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Scope

Deals with essential ratings and characteristics of semiconductor devices and general principles of measuring methods. This publication is intended to be used in conjunction with IEC 147-1 and 147-2.

Life cycle

NOW

WITHDRAWN
IEC 60147-0:1966 ED1
95.99 Withdrawal of Standard
Mar 31, 1995

REVISED BY

ABANDON
IEC 60147-0 ED2




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