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IEC 60096-2/AMD2 ED1

Amendment to IEC 96-2, regarding the displacement of a dielectric with respect to the inner conductor after the test for dimensional stability IEC 60096-2/AMD2 ED1

General information

10.98 New project rejected   Aug 11, 1997

IEC

TC 46/SC 46A

International Standard

Life cycle

PREVIOUSLY

WITHDRAWN
IEC 60096-2:1961 ED1

NOW

ABANDON
IEC 60096-2/AMD2 ED1
10.98 New project rejected
Aug 11, 1997