HD 396 S1:1979

Definitions of test method terms for semiconductor radiation detectors and scintillation counting HD 396 S1:1979

General information

99.60   Withdrawal effective   Jun 1, 2001

CENELEC

CLC/SR 45 Nuclear instrumentation

Harmonization Document

Scope

The definitions of this standard apply to the three following IEC Publications 1) Publication 333: Test Procedures for Semiconductor Detectors for Ionizing Radiation 2) Publication 430: Test Procedures for Germanium Gamma-ray Detectors 3) Publication 462: Standard Test Procedures for Photomultiplier Tubes for Scintillation Counting

Life cycle

NOW

WITHDRAWN
HD 396 S1:1979
99.60 Withdrawal effective
Jun 1, 2001

Relations

Adopted from IEC 60596:1978 IDENTICAL




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