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FprEN IEC 62047-35:2019

Semiconductor devices - Micro-electromechanical devices - Part 35: Test method of electrical characteristics under bending deformation for flexible electro-mechanical devices

General information

40.98   Project deleted   Sep 25, 2019

CENELEC

CLC/SR 47F Micro-electromechanical systems

European Norm

Life cycle

NOW

ABANDON
FprEN IEC 62047-35:2019
40.98 Project deleted
Sep 25, 2019