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EN 62276:2005

Single crystal wafers for surface acoustic wave (SAW) device appplications - Specifications and measuring methods EN 62276:2005

Publication date:   Aug 10, 2006

General information

99.60   Withdrawal effective   Nov 23, 2015

CENELEC

CLC/SR 49 Piezoelectric and dielectric devices for frequency control and selection

European Norm

31.140   Piezoelectric devices

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Scope

Provides specifications for manufacturing piezoelectric single crystal wafers to be used in surface acoustic wave devices. Applies to the manufacture of synthetic quartz, lithium niobate, lithium tantalate, lithium tetraborate, and lanthanum gallium silicate single crystal wafers intended for use as substrates in the manufacture of surface acoustic wave filters and resonators.

Life cycle

NOW

WITHDRAWN
EN 62276:2005
99.60 Withdrawal effective
Nov 23, 2015

REVISED BY

WITHDRAWN
EN 62276:2013




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