EN 62132-1:2016

Integrated circuits - Measurement of electromagnetic immunity - Part 1: General conditions and definitions

Publication date:   May 17, 2016

General information

60.60 Standard published   Feb 26, 2016

CENELEC

CLC/TC 47X

European Norm

31.200   Integrated circuits. Microelectronics

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Scope

IEC 62132-1:2015 provides general information and definitions about measurement of electromagnetic immunity of integrated circuits (ICs) to conducted and radiated disturbances. It also defines general test conditions, test equipment and setup, as well as the test procedures and content of the test reports for all parts of the IEC 62132 series. Test method comparison tables are included in Annex A to assist in selecting the appropriate measurement method(s). This edition includes the following significant technical changes with respect to the previous edition:

a) frequency range of 150 kHz to 1 GHz has been deleted from the title;

b) frequency step above 1 GHz has been added in Table 2 in 7.4.1;

c) IC performance classes in 8.3 have been modified;

d) Table A.1 was divided into two tables, and references to IEC 62132-8 and IEC 62132-9 have been added in the new Table A.2 in Annex A.

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PUBLISHED
EN 62132-1:2016
60.60 Standard published
Feb 26, 2016