60.60 Standard published Apr 23, 2003
CENELEC
European Norm
31.200 Integrated circuits. Microelectronics
Published
Describes a method to measure the conducted electromagnetic emission of integrated circuits either applied on a standardised test-board or on a final printed circuit board (PCB). Has a high repeatability and a good relationship to the measured RF emission of final applications with the integrated circuits used.
Legislation related to this standard
Directive 2004/108/EC of the European Parliament and of the Council of 15 December 2004 on the approximation of the laws of the Member States relating to electromagnetic compatibility and repealing Directive 89/336/EEC
Directive 2014/30/EU of the European Parliament and of the Council of 26 February 2014 on the harmonisation of the laws of the Member States relating to electromagnetic compatibility (recast)
PUBLISHED
EN 61967-5:2003
60.60
Standard published
Apr 23, 2003
