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EN 60747-5-3:2001

Discrete semiconductor devices and integrated circuits - Part 5-3: Optoelectronic devices - Measuring methods

Publication date:   Nov 20, 2003

General information

99.60   Withdrawal effective   Aug 30, 2023

CENELEC

CLC/SR 47E Discrete semiconductor devices

European Norm

31.260   Optoelectronics. Laser equipment

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Scope

Describes the measuring methods applicable to the optoelectronic devices which are not intended to be used in the fibre optic systems or subsystems.

Life cycle

NOW

WITHDRAWN
EN 60747-5-3:2001
99.60 Withdrawal effective
Aug 30, 2023

CORRIGENDA / AMENDMENTS

WITHDRAWN
EN 60747-5-3:2001/A1:2002

Relations

Adopted from IEC 60747-5-3:1997 IDENTICAL