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EN 60444-8:2003

Measurement of quartz crystal unit parameters - Part 8: Test fixture for surface mounted quartz crystal units EN 60444-8:2003

Publication date:   Aug 10, 2006

General information

99.60   Withdrawal effective   Jan 19, 2020

CENELEC

CLC/SR 49 Piezoelectric and dielectric devices for frequency control and selection

European Norm

31.140   Piezoelectric devices

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Scope

Explains the test fixture that allows the accurate measurement of resonance frequency, resonance resistance, and equivalent electrical circuit parameters of a leadless surface mounted quartz crystal units over the frequency range from 1 MHz to 150 MHz using zero phase technique as specified in EN 60444-4 and EN 60444-5.

Life cycle

NOW

WITHDRAWN
EN 60444-8:2003
99.60 Withdrawal effective
Jan 19, 2020

REVISED BY

PUBLISHED
EN 60444-8:2017




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