Measurement of quartz crystal unit parameters by zero phase technique in a pi-network - Part 3: Basic method for the measurement of two-terminal parameters of quartz crystal units up to 200 MHz by phase technique in a pi-network with compensation of the parallel capacitance C0 EN 60444-3:1997
Publication date:
Nov 20, 2003
General information
99.60Withdrawal effectiveAug 30, 2023
CENELEC
CLC/SR 49
Piezoelectric and dielectric devices for frequency control and selection
Specifies a method based on the -network for the measurement of the parameters of quartz crystal units using an inductance to compensate for the effects of Co at the frequency of the crystal unit. Two possible circuits for compensation of Co are discussed in detail. Has the status of a technical report.
Life cycle
NOW
WITHDRAWN EN 60444-3:1997 99.60
Withdrawal effective Aug 30, 2023
Relations
Adopted from
IEC/TR 60444-3:1986
IDENTICAL
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