0

EN 60444-2:1997

Measurement of quartz crystal unit parameters by zero phase technique in a pi-network - Part 2: Phase offset method for measurement of motional capacitance of quartz crystal units EN 60444-2:1997

Publication date:   Nov 20, 2003

General information

60.60   Standard published   Apr 16, 1997

CENELEC

CLC/SR 49 Piezoelectric and dielectric devices for frequency control and selection

European Norm

31.140   Piezoelectric devices

Buying

Published

Language in which you want to receive the document.

Scope

Describes a method of measuring the motional capacitance of quartz crystal units in the frequency range 1 MHz to 125 MHz with a total measurement error of the order of 5%.

Life cycle

NOW

PUBLISHED
EN 60444-2:1997
60.60 Standard published
Apr 16, 1997

Relations

Adopted from IEC 60444-2:1980 IDENTICAL




Access Genorma App Everywhere

Get fast and easy access to top European and International standards (EN, ISO, IEC) via your mobile phone, tablet or the web.

Google Play App Store Web Version