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EN 60444-2:1997

Measurement of quartz crystal unit parameters by zero phase technique in a pi-network - Part 2: Phase offset method for measurement of motional capacitance of quartz crystal units EN 60444-2:1997

Publication date:   Nov 20, 2003

General information

60.60 Standard published   Apr 16, 1997

CENELEC

CLC/SR 49 Piezoelectric and dielectric devices for frequency control and selection

European Norm

31.140   Piezoelectric devices

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Scope

Describes a method of measuring the motional capacitance of quartz crystal units in the frequency range 1 MHz to 125 MHz with a total measurement error of the order of 5%.

Life cycle

NOW

PUBLISHED
EN 60444-2:1997
60.60 Standard published
Apr 16, 1997

Relations

Adopted from IEC 60444-2:1980 IDENTICAL