ISO 18452:2005

Fine ceramics (advanced ceramics, advanced technical ceramics) — Determination of thickness of ceramic films by contact-probe profilometer ISO 18452:2005

General information

Current stage: 90.93 Standard confirmed Dec 5, 2019

Originator: ISO

Owner: ISO/TC 206 Fine ceramics

Type: International Standard

ICS: 81.060.30 Advanced ceramics

Scope

ISO 18452:2005 specifies a method for the determination of the film thickness of a fine ceramic film and ceramic coatings by a contact-probe profilometer. The method is suitable for film thicknesses in the range of 10 nm to 10 000 nm.

Life cycle

NOW

PUBLISHED
ISO 18452:2005
90.93 Standard confirmed
Dec 5, 2019