IEC TS 62607-6-6:2021 ED1

Nanomanufacturing - Key control characteristics - Part 6-6: Graphene - Strain uniformity: Raman spectroscopy IEC TS 62607-6-6:2021 ED1

Publication date:   Oct 14, 2021

General information

60.60 Standard published   Oct 14, 2021

IEC

TC 113

Technical Specification

07.120   Nanotechnologies

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Scope

IEC TS 62607-6-6:2021(E) establishes a standardized method to determine the structural key control characteristic
• strain uniformity
for single-layer graphene by
• Raman spectroscopy.
The width of the 2D-peak in the Raman spectrum is analysed to calculate the strain uniformity parameter which is a figure of merit to quantify the influence of nano-scale strain variations on the electronic properties of the layer. The classification will help manufacturers to classify their material quality to provide an upper limit of the electronic performance of the characterized graphene, to decide whether or not the graphene material quality is potentially suitable for various applications.

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PUBLISHED
IEC TS 62607-6-6:2021 ED1
60.60 Standard published
Oct 14, 2021