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IEC TS 62607-8-1:2020 ED1

Nanomanufacturing - Key control characteristics - Part 8-1: Nano-enabled metal-oxide interfacial devices - Test method for defect states by thermally stimulated current IEC TS 62607-8-1:2020 ED1

Publication date:   Apr 9, 2020

General information

60.60 Standard published   Apr 9, 2020

IEC

TC 113

Technical Specification

07.120   Nanotechnologies | 07.030   Physics. Chemistry

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IEC TS 62607-8-1:2020 There are two types of thermally stimulated current (TSC) measurement methods, classified by the origin of the current. One is generated by the detrapping of charges. The other one is generated by depolarization. IEC TS 62607-8-1:2020 focuses on the former method, and specifies the measurement method to be developed for determining defect states of nano-enabled metal-oxide interfacial devices.
IEC TS 62607-8-1:2020 includes:
– outlines of the experimental procedures used to measure TSC,
– methods of interpretation of results and discussion of data analysis, and
– case studies.

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PUBLISHED
IEC TS 62607-8-1:2020 ED1
60.60 Standard published
Apr 9, 2020