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IEC PAS 62276:2001 ED1

Single crystal wafers applied for surface acoustic wave device - Specification and measuring method

Publication date:   Aug 30, 2001

General information

99.60 Withdrawal effective   May 30, 2005

IEC

TC 49 Piezoelectric, dielectric and electrostatic devices and associated materials for frequency control, selection and detection

Publicly Available Specification

31.140   Piezoelectric devices

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Scope

Applies to single crystal wafers intended for manufacturing substrates made of synthetic quartz crystal, lithium niobate, lithium tantalate, lithium tetraborate crystals for surface acoustic wave (SAW) filters and resonators. Lays down specifications and measuring methods.

Life cycle

NOW

WITHDRAWN
IEC PAS 62276:2001 ED1
99.60 Withdrawal effective
May 30, 2005

REVISED BY

WITHDRAWN
IEC 62276:2005 ED1