60.60 Standard published Mar 16, 2023
IEC
International Standard
31.080.99 Other semiconductor devices
Published
IEC 60747-18-4:2023(E) specifies the evaluation method for noise characteristics of lens-free CMOS photonic array sensors. This document includes the measurement setup, test procedure, test items, evaluation method, and test report for noise characteristics of lens-free CMOS photonic array sensors.
PUBLISHED
IEC 60747-18-4:2023 ED1
60.60
Standard published
Mar 16, 2023