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IEC TS 62607-5-3:2020 ED1

Nanomanufacturing - Key control characteristics - Part 5-3: Thin-film organic/nano electronic devices – Measurements of charge carrier concentration IEC TS 62607-5-3:2020 ED1

Publication date:   Apr 14, 2020

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60.60 Standard published   Apr 14, 2020

IEC

TC 113

Technical Specification

07.030   Physics. Chemistry | 07.120   Nanotechnologies

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IEC TS 62607-5-3:2020 specifies sample structures for evaluating a wide range of charge carrier concentration in organic/nano materials. This specification is provided for both capacitance-voltage (C-V) measurements in metal/insulator/semiconductor stacking structures and Hall-effect measurements with the van der Pauw configuration. Criteria for choosing measurement methods of charge carrier concentration in organic semiconductor layers are also given in this document.

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PUBLISHED
IEC TS 62607-5-3:2020 ED1
60.60 Standard published
Apr 14, 2020