Standards search

Use the form below to find particular standards or projects. Enter your criteria for searching (single or in combination) in the fields below and press the button “Search”. You can also search using the Advance Search facility.

Optics and photonics — Optical coatings — Part 8: Minimum requirements for coatings used for laser optics

90.92 Standard to be revised

ISO/TC 172/SC 3

Optics and photonics — Optical transfer function — Application — Part 3: Telescopes

60.60 Standard published

ISO/TC 172/SC 4

Microscopes — Graticules for eyepieces

90.93 Standard confirmed

ISO/TC 172/SC 5

Microscopes — Interfacing dimensions for imaging components

90.20 Standard under periodical review

ISO/TC 172/SC 5

Optics and optical instruments — Veiling glare of image forming systems — Definitions and methods of measurement

90.20 Standard under periodical review

ISO/TC 172/SC 1

Optics and photonics — Specifications for binoculars, monoculars and spotting scopes - General purpose and high performance instruments

30.60 Close of voting/ comment period

ISO/TC 172/SC 4

Optics and photonics — Optical materials and components — Test method for striae in infrared optical materials

30.99 CD approved for registration as DIS

ISO/TC 172/SC 3

Optics and photonics — Preparation of drawings for optical elements and systems — Part 11: Non-toleranced data

40.60 Close of voting

ISO/TC 172/SC 1

Optics and photonics — Preparation of drawings for optical elements and systems — Part 6: Centring and tilt tolerances

40.60 Close of voting

ISO/TC 172/SC 1

Microscopes — Vocabulary for light microscopy

40.00 DIS registered

ISO/TC 172/SC 5

Optics and photonics — Lasers and laser-related equipment — Test methods for the spectral characteristics of lasers

40.99 Full report circulated: DIS approved for registration as FDIS

ISO/TC 172/SC 9

Microscopes — Microscopes with digital imaging displays — Information provided to the user regarding imaging performance

40.00 DIS registered

ISO/TC 172/SC 5

Microbeam analysis — Analytical electron microscopy — Method for the determination of interface position in the cross-sectional image of the layered materials

40.20 DIS ballot initiated: 12 weeks

ISO/TC 202/SC 3

Endoscopes — Medical endoscopes and endotherapy devices — Part 1: General requirements

40.00 DIS registered

ISO/TC 172/SC 5

Optics and photonics — Optical materials and components — Specification of chalcogenide glass used in the infrared spectrum

50.20 Proof sent to secretariat or FDIS ballot initiated: 8 weeks

ISO/TC 172/SC 3

Optics and photonics — Test methods for surface imperfections of optical elements — Part 2: Machine vision

60.60 Standard published

ISO/TC 172/SC 1

Optics and photonics — Interferometric measurement of optical elements and optical systems — Part 1: Terms, definitions and fundamental relationships

60.60 Standard published

ISO/TC 172/SC 1

Optics and photonics — Interferometric measurement of optical elements and optical systems — Part 2: Measurement and evaluation techniques

60.60 Standard published

ISO/TC 172/SC 1