PWI 113-168

Nanomanufacturing - Key control characteristics - Part 12-01: 2D material related products - Density of interface traps: I-V curve analysis of field effect transistors: PWI 113-168

General information

00.00 Proposal for new project received   Dec 12, 2024

PREPNW    Dec 31, 2025

IEC

TC 113

International Standard

Life cycle

NOW

IN_DEVELOPMENT
PWI 113-168
00.00 Proposal for new project received
Dec 12, 2024