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prEN IEC 63287-4

Semiconductor devices - Guidelines for reliability qualification plans - Part 4: Early failure assessment prEN IEC 63287-4

General information

10.99 New project approved   Jul 8, 2024

CENELEC

CLC/TC 47X

European Norm

31.080.01   Semiconductor devices in general

Life cycle

NOW

IN_DEVELOPMENT
prEN IEC 63287-4
10.99 New project approved
Jul 8, 2024