ISO/DIS 16666

Surface chemical analysis — Total reflection X-ray fluorescence — Principles and general requirements ISO/DIS 16666

General information

40.00 DIS registered   Dec 16, 2024

ISO

ISO/TC 201/SC 10 X-ray Reflectometry (XRR) and X-ray Fluorescence (XRF) Analysis

International Standard

71.040.40   Chemical analysis

Scope

This document specifies terms and definitions for analytical methods where elements are identified and their concentrations determined by measuring X ray fluorescence radiation.
The aim of this document is to establish terms and definitions for TXRF and to match these with terms and definitions relating to X ray fluorescence analysis.

Life cycle

NOW

IN_DEVELOPMENT
ISO/DIS 16666
40.00 DIS registered
Dec 16, 2024